... the test section. The use of Focused Ion Beam (FIB) is a novel approach to evaluate the corrosion product layer evolution and the cross-sectional scale morphology. The extensive use of FIB as a site selective tool in failure analysis fields has shown interesting results. ^{16 , 17} Cross sectional...

... ion beam microscope (FIB), is highlighted as a possible alternative to the scanning electron microscope (SEM) and the electron probe microanalyzer (EPMA). The FIB microscope provided exceptional new possibilities for examining heat resistant alloys, primarily due to its ability to section samples...