As new advanced surface analysis techniques are developed, previously inaccessible information relating to scaling processes can be studied. In this paper the introduction of the Atomic Force Microscope (AFM) as one of the family of scanning probe techniques is presented for the study of calcareous deposition under an applied potential. In the paper the potential for using in-situ AFM is presented and the limitations in its use are assessed. The AFM will facilitate viewing, at a micro or nanoscopic level, surfaces processes relating to nucleation and growth of scale and will offer new insights into scaling processes and mechanisms.

Subject
Ions, Atomic force microscopy, Scale inhibitors, Nucleation, Surfaces, Liquids, Crystal growth, Scale formation, Scale, Brines, Deposit corrosion, Electrochemical potential, Scaling
© 2004 Association for Materials Protection and Performance (AMPP). All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted, in any form or by any means (electronic, mechanical, photocopying, recording, or otherwise) without the prior written permission of AMPP. Positions and opinions advanced in this work are those of the author(s) and not necessarily those of AMPP. Responsibility for the content of the work lies solely with the author(s).
2004
Association for Materials Protection and Performance (AMPP)
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