This paper examines the way in which the image is formed during a SRET measurement, and considers some of the potential sources of error in the measurement. Methods for the enhancement of images to increase the resolution are discussed, and the impact of the various error types on image enhancement processes is considered. It is shown that ideal images can be significantly improved by the conventional image method of Fourier Transform Deconvolution, but that typical errors present in the measurement are liable to seriously limit the capacity for enhancement.

Subject
Working electrodes, Electric current, Circuits, Electrochemical noise, Reference electrodes, Electrolyte resistance, Waves, Surfaces, Potential measurements, Lead, Electrodes, Electrolytes, Electrode potential
Keywords:
scanning reference electrode technique, SRET, Fourier transform Deconvolution, image enhancement
© 2005 Association for Materials Protection and Performance (AMPP). All rights reserved. No part of this publication may be reproduced, stored in a retrieval system, or transmitted, in any form or by any means (electronic, mechanical, photocopying, recording, or otherwise) without the prior written permission of AMPP. Positions and opinions advanced in this work are those of the author(s) and not necessarily those of AMPP. Responsibility for the content of the work lies solely with the author(s).
2005
Association for Materials Protection and Performance (AMPP)
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