The region between manganese sulfide (MnS) inclusions and the matrix in several stainless steels (SS) was carefully characterized using high-resolution scanning transmission electron microscopy (STEM) line profiling in combination with focused ion beam (FIB) sectioning and secondary ion mass spectrometry (SIMS) mapping. In contradiction to the recent findings of Ryan, et al., no Cr depletion zone around MnS inclusions was found in the SS, including the exact Type 316F (UNS S31620) SS sample used in their study.

Subject
Pits, Energy dispersive X-ray spectroscopy, Materials, Ions, Composition, Oxides, Transmission electron microscopy, Micrography, Manganese, Interfaces, Sulfides, Inclusions, Samples
Keywords:
inclusions, sensitization, stainless steels
NACE International
2004
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